A hybrid pixel detector for scanning electron microscopy (SEM). It mounts inside the SEM chamber and enables 3D electron diffraction (3D-ED) and 4D-STEM, bringing crystal-structure determination and orientation mapping of electron-transparent samples to nanometer-scale resolution while keeping all SEM functions available.
The Detectors Behind your discovery!
FeliS is a hybrid pixel detector that mounts inside the SEM chamber and enables transmission electron diffraction. This supports crystal-structure determination and orientation mapping of electron-transparent samples, from nanoparticles and 2D materials to thin biological specimens, at nanometer-scale resolution, without removing other SEM functions.
Built on the Medipix3 and Timepix3 ASICs from the CERN Medipix collaboration, FeliS combines zero-noise single-electron counting with high-speed, event-based detection. Frame-less acquisition records only meaningful electron interactions, which improves dataset completeness and structure-determination accuracy and keeps data volumes manageable. A motorised retractable lid provides dual-beam compatibility, and open data export works with the tools the community already uses.
Key features
Crystal-structure determination of nanoparticles, 2D materials, and beam-sensitive specimens directly in the SEM.
High-speed diffraction mapping for strain, orientation, phase, and electric-field analysis.
Crystallographic orientation mapping of electron-transparent samples at nanometer-scale resolution.
Fast, high-dynamic-range crystallographic mapping with event-based detection.
Characterization of beam-sensitive materials such as polymers, soft matter, and thin biological specimens.
3D-ED and 4D-STEM alongside EDS, BSE, EBSD, and FIB, with no chamber venting required.
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